%0 Journal Article %1 chatterjee2022comprehensive %A Chatterjee, Swetaki %A Thomann, Simon %A Ni, Kai %A Chauhan, Yogesh Singh %A Amrouch, Hussam %D 2022 %I IEEE %J IEEE transactions on electron devices %K mult ubs_10005 ubs_20008 ubs_30085 ubs_40304 ubs_40416 unibibliografie wos %N 9 %P 5316-5323 %R 10.1109/TED.2022.3192808 %T Comprehensive Variability Analysis in Dual-Port FeFET for Reliable Multi-Level-Cell Storage %V 69

@article{chatterjee2022comprehensive, added-at = {2023-01-13T11:54:09.000+0100}, affiliation = {Chatterjee, S (Corresponding Author), Univ Stuttgart, Chair Semicond Test & Reliablil STAR, D-70569 Stuttgart, Germany. Chatterjee, S (Corresponding Author), Indian Inst Technol Kanpur, Dept Elect Engn, Kanpur 208016, Uttar Pradesh, India. Chatterjee, Swetaki; Thomann, Simon; Amrouch, Hussam, Univ Stuttgart, Chair Semicond Test & Reliablil STAR, D-70569 Stuttgart, Germany. Chatterjee, Swetaki; Chauhan, Yogesh Singh, Indian Inst Technol Kanpur, Dept Elect Engn, Kanpur 208016, Uttar Pradesh, India. Ni, Kai, Rochester Inst Technol, Rochester, NY 14623 USA.}, author = {Chatterjee, Swetaki and Thomann, Simon and Ni, Kai and Chauhan, Yogesh Singh and Amrouch, Hussam}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/268edecb37a99ffb11e1e2b12d81897e6/unibiblio}, doi = {10.1109/TED.2022.3192808}, interhash = {c8db93a7f25b67e010a6c3ad23f203f2}, intrahash = {68edecb37a99ffb11e1e2b12d81897e6}, issn = {{0018-9383} and {1557-9646}}, journal = {IEEE transactions on electron devices}, keywords = {mult ubs_10005 ubs_20008 ubs_30085 ubs_40304 ubs_40416 unibibliografie wos}, language = {eng}, number = 9, pages = {5316-5323}, publisher = {IEEE}, research-areas = {Engineering; Physics}, timestamp = {2023-01-13T10:54:09.000+0100}, title = {Comprehensive Variability Analysis in Dual-Port FeFET for Reliable Multi-Level-Cell Storage}, unique-id = {WOS:000833049000001}, volume = 69, year = 2022 }