%0 Journal Article %1 journals/mr/ZhaoWTYLFTHHWZC16 %A Zhao, Yuzhe %A Wang, Q. J. %A Tan, Pik Kee %A Yap, H. H. %A Liu, Binghai %A Feng, H. %A Tan, Hao %A He, Ran %A Huang, Y. M. %A Wang, D. D. %A Zhu, L. %A Chen, C. Q. %A Rivai, Francis %A Lam, Jeffery %A Mai, Zhihong %D 2016 %J Microelectronics Reliability %K dblp %P 362-366 %T Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system. %U http://dblp.uni-trier.de/db/journals/mr/mr64.html#ZhaoWTYLFTHHWZC16 %V 64

@article{journals/mr/ZhaoWTYLFTHHWZC16, added-at = {2018-10-16T00:00:00.000+0200}, author = {Zhao, Yuzhe and Wang, Q. J. and Tan, Pik Kee and Yap, H. H. and Liu, Binghai and Feng, H. and Tan, Hao and He, Ran and Huang, Y. M. and Wang, D. D. and Zhu, L. and Chen, C. Q. and Rivai, Francis and Lam, Jeffery and Mai, Zhihong}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2251923211d23f9c361430d39a3082b55/dblp}, ee = {https://doi.org/10.1016/j.microrel.2016.07.060}, interhash = {c1da38a00ff87f5bdc4b6c70088726bb}, intrahash = {251923211d23f9c361430d39a3082b55}, journal = {Microelectronics Reliability}, keywords = {dblp}, pages = {362-366}, timestamp = {2019-09-27T10:58:31.000+0200}, title = {Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#ZhaoWTYLFTHHWZC16}, volume = 64, year = 2016 }