%0 Conference Paper %1 conf/isqed/DongCKJKS19 %A Dong, Z. %A Cao, X. %A Karim, M. Ahosan Ul %A Joshi, V. %A Klick, T. %A Schmid, J. %B ISQED %D 2019 %I IEEE %K dblp %P 98-103 %T Simulation Based Assessment of SRAM Data Retention Voltage. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2019.html#DongCKJKS19 %@ 978-1-7281-0392-1

@inproceedings{conf/isqed/DongCKJKS19, added-at = {2019-05-04T00:00:00.000+0200}, author = {Dong, Z. and Cao, X. and Karim, M. Ahosan Ul and Joshi, V. and Klick, T. and Schmid, J.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/248af3eabaedaf37bec8d04a132156c8a/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2019}, ee = {https://doi.org/10.1109/ISQED.2019.8697425}, interhash = {c08b826d9379801352d79e00681547c0}, intrahash = {48af3eabaedaf37bec8d04a132156c8a}, isbn = {978-1-7281-0392-1}, keywords = {dblp}, pages = {98-103}, publisher = {IEEE}, timestamp = {2019-09-27T17:23:43.000+0200}, title = {Simulation Based Assessment of SRAM Data Retention Voltage.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2019.html#DongCKJKS19}, year = 2019 }