%0 Journal Article %1 journals/mr/DouglasCGHJLKJVRP12 %A Douglas, E. A. %A Chang, C. Y. %A Gila, B. P. %A Holzworth, M. R. %A Jones, K. S. %A Liu, Lu %A Kim, Jinhyung %A Jang, Soohwan %A Via, G. D. %A Ren, Fan %A Pearton, Stephen J. %D 2012 %J Microelectronics Reliability %K dblp %N 1 %P 23-28 %T Investigation of the effect of temperature during off-state degradation of AlGaN/GaN High Electron Mobility Transistors. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#DouglasCGHJLKJVRP12 %V 52

@article{journals/mr/DouglasCGHJLKJVRP12, added-at = {2019-11-05T00:00:00.000+0100}, author = {Douglas, E. A. and Chang, C. Y. and Gila, B. P. and Holzworth, M. R. and Jones, K. S. and Liu, Lu and Kim, Jinhyung and Jang, Soohwan and Via, G. D. and Ren, Fan and Pearton, Stephen J.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/21ad062ee24c14afaa295831b43748129/dblp}, ee = {https://doi.org/10.1016/j.microrel.2011.09.018}, interhash = {c06e415cbed756c883c21f3a2b62f275}, intrahash = {1ad062ee24c14afaa295831b43748129}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 1, pages = {23-28}, timestamp = {2019-11-26T07:53:13.000+0100}, title = {Investigation of the effect of temperature during off-state degradation of AlGaN/GaN High Electron Mobility Transistors.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#DouglasCGHJLKJVRP12}, volume = 52, year = 2012 }