%0 Journal Article %1 journals/mr/GhoshMMGKZ10 %A Ghosh, Sudip %A Marc, François %A Maneux, Cristell %A Grandchamp, Brice %A Koné, G. A. %A Zimmer, Thomas %D 2010 %J Microelectronics Reliability %K dblp %N 9-11 %P 1554-1558 %T Thermal aging model of InP/InGaAs/InP DHBT. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#GhoshMMGKZ10 %V 50

@article{journals/mr/GhoshMMGKZ10, added-at = {2018-11-30T00:00:00.000+0100}, author = {Ghosh, Sudip and Marc, François and Maneux, Cristell and Grandchamp, Brice and Koné, G. A. and Zimmer, Thomas}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/200e2204969a44dedb0d1f1961a0ab065/dblp}, ee = {https://doi.org/10.1016/j.microrel.2010.07.097}, interhash = {be5b8f7379379aa43e5e0878dbb2d2ae}, intrahash = {00e2204969a44dedb0d1f1961a0ab065}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1554-1558}, timestamp = {2019-09-27T10:58:29.000+0200}, title = {Thermal aging model of InP/InGaAs/InP DHBT.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#GhoshMMGKZ10}, volume = 50, year = 2010 }