S. Reichelt, C. Pruss, and H. Tiziani. Proc. SPIE 5252, Optical Fabrication, Testing, and Metrology, International Society for Optics and Photonics, SPIE, (February 2004)
DOI: 10.1117/12.513364
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%0 Conference Paper
%1 Reichelt_2004
%A Reichelt, Stephan
%A Pruss, Christof
%A Tiziani, Hans J.
%B Proc. SPIE 5252, Optical Fabrication, Testing, and Metrology
%D 2004
%E Geyl, Roland
%E Rimmer, David
%E Wang, Lingli
%I SPIE
%K
%R 10.1117/12.513364
%T Absolute testing of aspheric surfaces
@inproceedings{Reichelt_2004,
added-at = {2023-08-16T15:48:00.000+0200},
author = {Reichelt, Stephan and Pruss, Christof and Tiziani, Hans J.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/258e57c55f728d115e2df4fea25ea98d0/cp},
booktitle = {Proc. SPIE 5252, Optical Fabrication, Testing, and Metrology},
doi = {10.1117/12.513364},
editor = {Geyl, Roland and Rimmer, David and Wang, Lingli},
interhash = {bdc482d1a9bdff63e4dab96f7a575e6f},
intrahash = {58e57c55f728d115e2df4fea25ea98d0},
keywords = {},
month = {2},
organization = {International Society for Optics and Photonics},
publisher = {{SPIE}},
timestamp = {2023-08-16T13:48:00.000+0200},
title = {Absolute testing of aspheric surfaces},
year = 2004
}
