Metal-Porous Silicon Contacts and Electrical Resistivity of Porous Silicon
S. Ferwana, E. Angelopoulos, T. Zehender, M. Zimmermann, C. Harendt, and J. Burghartz. Proceedings : SAFE 2009, 12th Annual Workshop on Semiconductors Advances for Future Electronics and Sensors and ProRISC 2009, 20th Annual Workshop on Circuits, Systems and Signal Processing : November 26 - 27, 2009, Veldhoven, the Netherlands, page 71-74. Utrecht, Techn. Foundation, (2009)
Proceedings : SAFE 2009, 12th Annual Workshop on Semiconductors Advances for Future Electronics and Sensors and ProRISC 2009, 20th Annual Workshop on Circuits, Systems and Signal Processing : November 26 - 27, 2009, Veldhoven, the Netherlands
year
2009
pages
71-74
publisher
Techn. Foundation
venue
Veldhoven, The Netherlands
isbn
9789073461628
eventdate
2009-11-26/2009-11-27
eventtitle
SAFE 2009, 12th Annual Workshop on Semiconductors Advances for Future Electronics and Sensors and ProRISC 2009, 20th Annual Workshop on Circuits, Systems and Signal Processing
Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Conference Paper
%1 ferwana2009metalporous
%A Ferwana, Saleh
%A Angelopoulos, Evangelos
%A Zehender, Tilman
%A Zimmermann, Martin
%A Harendt, Christine
%A Burghartz, Joachim N.
%B Proceedings : SAFE 2009, 12th Annual Workshop on Semiconductors Advances for Future Electronics and Sensors and ProRISC 2009, 20th Annual Workshop on Circuits, Systems and Signal Processing : November 26 - 27, 2009, Veldhoven, the Netherlands
%C Utrecht
%D 2009
%I Techn. Foundation
%K INES
%P 71-74
%T Metal-Porous Silicon Contacts and Electrical Resistivity of Porous Silicon
%@ 9789073461628
@inproceedings{ferwana2009metalporous,
added-at = {2019-03-13T18:33:39.000+0100},
address = {Utrecht},
author = {Ferwana, Saleh and Angelopoulos, Evangelos and Zehender, Tilman and Zimmermann, Martin and Harendt, Christine and Burghartz, Joachim N.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2efefd4a192781580108fa6e295da24dd/kevin.konnerth},
booktitle = {Proceedings : SAFE 2009, 12th Annual Workshop on Semiconductors Advances for Future Electronics and Sensors [and] ProRISC 2009, 20th Annual Workshop on Circuits, Systems and Signal Processing : November 26 - 27, 2009, Veldhoven, the Netherlands},
eventdate = {2009-11-26/2009-11-27},
eventtitle = {SAFE 2009, 12th Annual Workshop on Semiconductors Advances for Future Electronics and Sensors [and] ProRISC 2009, 20th Annual Workshop on Circuits, Systems and Signal Processing},
interhash = {b9775a00790200e43a60277c070af198},
intrahash = {efefd4a192781580108fa6e295da24dd},
isbn = {9789073461628},
keywords = {INES},
pages = {71-74},
publisher = {Techn. Foundation},
timestamp = {2019-03-13T17:33:39.000+0100},
title = {Metal-Porous Silicon Contacts and Electrical Resistivity of Porous Silicon},
venue = {Veldhoven, The Netherlands},
year = 2009
}