%0 Journal Article %1 journals/mr/AlbadriSGW06 %A Albadri, A. M. %A Schrimpf, Ronald D. %A Galloway, Kenneth F. %A Walker, D. Greg %D 2006 %J Microelectronics Reliability %K dblp %N 2-4 %P 317-325 %T Single event burnout in power diodes: Mechanisms and models. %U http://dblp.uni-trier.de/db/journals/mr/mr46.html#AlbadriSGW06 %V 46

@article{journals/mr/AlbadriSGW06, added-at = {2016-03-11T00:00:00.000+0100}, author = {Albadri, A. M. and Schrimpf, Ronald D. and Galloway, Kenneth F. and Walker, D. Greg}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2fd5129fd84696cdc411a188c4911542a/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2005.06.015}, interhash = {b8531d5cdab514d74bff21c3e0d616db}, intrahash = {fd5129fd84696cdc411a188c4911542a}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {2-4}, pages = {317-325}, timestamp = {2016-03-12T10:31:54.000+0100}, title = {Single event burnout in power diodes: Mechanisms and models.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#AlbadriSGW06}, volume = 46, year = 2006 }