Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Journal Article
%1 journals/mr/BenbakhtiAKLHBMTA10
%A Benbakhti, B.
%A Ayubi-Moak, J. S.
%A Kalna, Karol
%A Lin, D.
%A Hellings, Geert
%A Brammertz, G.
%A Meyer, Kristin De
%A Thayne, I.
%A Asenov, Asen
%D 2010
%J Microelectronics Reliability
%K dblp
%N 3
%P 360-364
%T Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures.
%U http://dblp.uni-trier.de/db/journals/mr/mr50.html#BenbakhtiAKLHBMTA10
%V 50
@article{journals/mr/BenbakhtiAKLHBMTA10,
added-at = {2016-05-18T00:00:00.000+0200},
author = {Benbakhti, B. and Ayubi-Moak, J. S. and Kalna, Karol and Lin, D. and Hellings, Geert and Brammertz, G. and Meyer, Kristin De and Thayne, I. and Asenov, Asen},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a614688155dec2fe312810b2d4393625/dblp},
ee = {http://dx.doi.org/10.1016/j.microrel.2009.11.017},
interhash = {b1d27a5124b66f4c7c37c40b1a218649},
intrahash = {a614688155dec2fe312810b2d4393625},
journal = {Microelectronics Reliability},
keywords = {dblp},
number = 3,
pages = {360-364},
timestamp = {2016-05-19T09:31:58.000+0200},
title = {Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#BenbakhtiAKLHBMTA10},
volume = 50,
year = 2010
}