%0 Conference Paper %1 conf/isqed/HwangKK10 %A Hwang, Eun Ju %A Kim, Wook %A Kim, Young Hwan %B ISQED %D 2010 %I IEEE %K dblp %P 812-817 %T Improving the process variation tolerability of flip-flops for UDSM circuit design. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2010.html#HwangKK10 %@ 978-1-4244-6455-5

@inproceedings{conf/isqed/HwangKK10, added-at = {2010-04-22T00:00:00.000+0200}, author = {Hwang, Eun Ju and Kim, Wook and Kim, Young Hwan}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2becc6f83f3b033d1b146831f0328944b/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2010}, ee = {http://dx.doi.org/10.1109/ISQED.2010.5450488}, interhash = {b163c1a5a4b57cf8d1db29007efc105e}, intrahash = {becc6f83f3b033d1b146831f0328944b}, isbn = {978-1-4244-6455-5}, keywords = {dblp}, pages = {812-817}, publisher = {IEEE}, timestamp = {2016-02-02T13:53:02.000+0100}, title = {Improving the process variation tolerability of flip-flops for UDSM circuit design.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2010.html#HwangKK10}, year = 2010 }