%0 Journal Article %1 journals/mr/FengWYDIK14 %A Feng, Xuan %A Wong, Hei %A Yang, B. L. %A Dong, Shurong %A Iwai, Hiroshi %A Kakushima, Kuniyuki %D 2014 %J Microelectronics Reliability %K dblp %N 6-7 %P 1133-1136 %T On the current conduction mechanisms of CeO2/La2O3 stacked gate dielectric. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#FengWYDIK14 %V 54

@article{journals/mr/FengWYDIK14, added-at = {2018-11-30T00:00:00.000+0100}, author = {Feng, Xuan and Wong, Hei and Yang, B. L. and Dong, Shurong and Iwai, Hiroshi and Kakushima, Kuniyuki}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2f3cdf112b36309ea7749488a44c0c919/dblp}, ee = {https://doi.org/10.1016/j.microrel.2013.12.014}, interhash = {b128f4070c06631bc16d7a8e3c4c2bbc}, intrahash = {f3cdf112b36309ea7749488a44c0c919}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {6-7}, pages = {1133-1136}, timestamp = {2019-09-27T10:58:13.000+0200}, title = {On the current conduction mechanisms of CeO2/La2O3 stacked gate dielectric.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#FengWYDIK14}, volume = 54, year = 2014 }