%0 Conference Paper %1 conf/icecsys/ChebliSS05 %A Chebli, Robert %A Sawan, Mohamad %A Savaria, Yvon %B ICECS %D 2005 %I IEEE %K dblp %P 1-4 %T Gate oxide protection in HV CMOS/DMOS integrated circuits: Design and experimental results. %U http://dblp.uni-trier.de/db/conf/icecsys/icecsys2005.html#ChebliSS05 %@ 978-9972-61-100-1

@inproceedings{conf/icecsys/ChebliSS05, added-at = {2014-04-29T00:00:00.000+0200}, author = {Chebli, Robert and Sawan, Mohamad and Savaria, Yvon}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a55c1ec7f3ba54edf0cae84c9d384b1a/dblp}, booktitle = {ICECS}, crossref = {conf/icecsys/2005}, ee = {http://dx.doi.org/10.1109/ICECS.2005.4633435}, interhash = {afdc74a8229080922650d308a9dbce31}, intrahash = {a55c1ec7f3ba54edf0cae84c9d384b1a}, isbn = {978-9972-61-100-1}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2016-02-02T12:36:20.000+0100}, title = {Gate oxide protection in HV CMOS/DMOS integrated circuits: Design and experimental results.}, url = {http://dblp.uni-trier.de/db/conf/icecsys/icecsys2005.html#ChebliSS05}, year = 2005 }