%0 Journal Article %1 journals/et/GhaidaZ09 %A Ghaida, Rani S. %A Zarkesh-Ha, Payman %D 2009 %J J. Electronic Testing %K dblp %N 1 %P 67-77 %T A Layout Sensitivity Model for Estimating Electromigration-vulnerable Narrow Interconnects. %U http://dblp.uni-trier.de/db/journals/et/et25.html#GhaidaZ09 %V 25

@article{journals/et/GhaidaZ09, added-at = {2009-03-22T00:00:00.000+0100}, author = {Ghaida, Rani S. and Zarkesh-Ha, Payman}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e63bf2a8a409180bb31e3bfd7a12f321/dblp}, ee = {http://dx.doi.org/10.1007/s10836-008-5079-x}, interhash = {ae7f661b232afc8114f4aac11540b089}, intrahash = {e63bf2a8a409180bb31e3bfd7a12f321}, journal = {J. Electronic Testing}, keywords = {dblp}, number = 1, pages = {67-77}, timestamp = {2016-02-02T10:07:28.000+0100}, title = {A Layout Sensitivity Model for Estimating Electromigration-vulnerable Narrow Interconnects.}, url = {http://dblp.uni-trier.de/db/journals/et/et25.html#GhaidaZ09}, volume = 25, year = 2009 }