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%0 Conference Paper
%1 conf/itc/HongLPMLKHNGM10
%A Hong, Ted
%A Li, Yanjing
%A Park, Sung-Boem
%A Mui, Diana
%A Lin, David
%A Kaleq, Ziyad Abdel
%A Hakim, Nagib
%A Naeimi, Helia
%A Gardner, Donald S.
%A Mitra, Subhasish
%B ITC
%D 2010
%E Press, Ron
%E Volkerink, Erik H.
%I IEEE Computer Society
%K dblp
%P 154-163
%T QED: Quick Error Detection tests for effective post-silicon validation.
%U http://dblp.uni-trier.de/db/conf/itc/itc2010.html#HongLPMLKHNGM10
%@ 978-1-4244-7206-2
@inproceedings{conf/itc/HongLPMLKHNGM10,
added-at = {2019-02-13T00:00:00.000+0100},
author = {Hong, Ted and Li, Yanjing and Park, Sung-Boem and Mui, Diana and Lin, David and Kaleq, Ziyad Abdel and Hakim, Nagib and Naeimi, Helia and Gardner, Donald S. and Mitra, Subhasish},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/238971369bec0845b913cbd01cc9490b6/dblp},
booktitle = {ITC},
crossref = {conf/itc/2010},
editor = {Press, Ron and Volkerink, Erik H.},
ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2010.5699215},
interhash = {ac3866b68bde2230ea877af364e59000},
intrahash = {38971369bec0845b913cbd01cc9490b6},
isbn = {978-1-4244-7206-2},
keywords = {dblp},
pages = {154-163},
publisher = {IEEE Computer Society},
timestamp = {2019-09-27T19:28:36.000+0200},
title = {QED: Quick Error Detection tests for effective post-silicon validation.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2010.html#HongLPMLKHNGM10},
year = 2010
}