%0 Conference Paper %1 conf/ets/SureshSO12 %A Suresh, Chandra K. H. %A Sinanoglu, Ozgur %A Ozev, Sule %B European Test Symposium %D 2012 %I IEEE Computer Society %K dblp %P 1-6 %T Adaptive testing of chips with varying distributions of unknown response bits. %U http://dblp.uni-trier.de/db/conf/ets/ets2012.html#SureshSO12 %@ 978-1-4673-0697-3

@inproceedings{conf/ets/SureshSO12, added-at = {2012-07-10T00:00:00.000+0200}, author = {Suresh, Chandra K. H. and Sinanoglu, Ozgur and Ozev, Sule}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/296cc0e29b88a5dd209606ecd4dcb5371/dblp}, booktitle = {European Test Symposium}, crossref = {conf/ets/2012}, ee = {http://dx.doi.org/10.1109/ETS.2012.6233023}, interhash = {aa1c6d9ce218039f2dbba8fef2611443}, intrahash = {96cc0e29b88a5dd209606ecd4dcb5371}, isbn = {978-1-4673-0697-3}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T15:20:06.000+0100}, title = {Adaptive testing of chips with varying distributions of unknown response bits.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2012.html#SureshSO12}, year = 2012 }