%0 Journal Article %1 journals/tcad/RangavajjhalaBK93 %A Rangavajjhala, Venkata S. %A Bhuva, Bharat L. %A Kerns, Sherra E. %D 1993 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 6 %P 837-844 %T Statistical degradation analysis of digital CMOS IC's. %U http://dblp.uni-trier.de/db/journals/tcad/tcad12.html#RangavajjhalaBK93 %V 12

@article{journals/tcad/RangavajjhalaBK93, added-at = {2016-03-18T00:00:00.000+0100}, author = {Rangavajjhala, Venkata S. and Bhuva, Bharat L. and Kerns, Sherra E.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/25b8b773364cc2643a4813de23a06ee4b/dblp}, ee = {http://dx.doi.org/10.1109/43.229759}, interhash = {a8b3154a7b7ff63eacf4d5851fd5af78}, intrahash = {5b8b773364cc2643a4813de23a06ee4b}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 6, pages = {837-844}, timestamp = {2016-03-19T10:32:42.000+0100}, title = {Statistical degradation analysis of digital CMOS IC's.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad12.html#RangavajjhalaBK93}, volume = 12, year = 1993 }