%0 Journal Article %1 journals/mr/AndradeMACSC14 %A de Andrade, Maria Glória Caño %A Martino, João Antonio %A Aoulaiche, Marc %A Collaert, Nadine %A Simoen, Eddy %A Claeys, Cor %D 2014 %J Microelectronics Reliability %K dblp %N 11 %P 2349-2354 %T Investigation of Bulk and DTMOS triple-gate devices under 60 MeV proton irradiation. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#AndradeMACSC14 %V 54

@article{journals/mr/AndradeMACSC14, added-at = {2015-03-26T00:00:00.000+0100}, author = {de Andrade, Maria Glória Caño and Martino, João Antonio and Aoulaiche, Marc and Collaert, Nadine and Simoen, Eddy and Claeys, Cor}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/26f1f6b54c6f6d0d981b0d677dc06f66e/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2014.06.013}, interhash = {a5bde05aa8a617b1720266e356ed07a3}, intrahash = {6f1f6b54c6f6d0d981b0d677dc06f66e}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 11, pages = {2349-2354}, timestamp = {2016-02-02T02:01:46.000+0100}, title = {Investigation of Bulk and DTMOS triple-gate devices under 60 MeV proton irradiation.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#AndradeMACSC14}, volume = 54, year = 2014 }