%0 Journal Article %1 journals/tcad/ThalhammerW04a %A Thalhammer, Robert K. %A Wachutka, Gerhard K. M. %D 2004 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 4 %P 581-582 %T Corrections to "Physically Rigorous Modeling of Internal Laser-Probing Techniques for Microstructured Semiconductor Devices". %U http://dblp.uni-trier.de/db/journals/tcad/tcad23.html#ThalhammerW04a %V 23

@article{journals/tcad/ThalhammerW04a, added-at = {2016-03-18T00:00:00.000+0100}, author = {Thalhammer, Robert K. and Wachutka, Gerhard K. M.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/257f10a32a3947a3f86d8366fec5ca0f3/dblp}, ee = {http://dx.doi.org/10.1109/TCAD.2004.825598}, interhash = {a591f1d5322ef94eb152daf505685ff5}, intrahash = {57f10a32a3947a3f86d8366fec5ca0f3}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 4, pages = {581-582}, timestamp = {2016-03-19T10:32:53.000+0100}, title = {Corrections to "Physically Rigorous Modeling of Internal Laser-Probing Techniques for Microstructured Semiconductor Devices".}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad23.html#ThalhammerW04a}, volume = 23, year = 2004 }