%0 Journal Article %1 journals/eswa/LiuLC11 %A Liu, Yi-Hung %A Liu, Yan-Chen %A Chen, Yen-Zen %D 2011 %J Expert Syst. Appl. %K dblp %N 5 %P 6222-6231 %T High-speed inline defect detection for TFT-LCD array process using a novel support vector data description. %U http://dblp.uni-trier.de/db/journals/eswa/eswa38.html#LiuLC11 %V 38

@article{journals/eswa/LiuLC11, added-at = {2011-02-09T00:00:00.000+0100}, author = {Liu, Yi-Hung and Liu, Yan-Chen and Chen, Yen-Zen}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e341348ea7622ea73c4c8936b7442fb0/dblp}, ee = {http://dx.doi.org/10.1016/j.eswa.2010.11.046}, interhash = {a2dbf062b05cee5a4c75e4abab189569}, intrahash = {e341348ea7622ea73c4c8936b7442fb0}, journal = {Expert Syst. Appl.}, keywords = {dblp}, number = 5, pages = {6222-6231}, timestamp = {2016-02-02T03:18:03.000+0100}, title = {High-speed inline defect detection for TFT-LCD array process using a novel support vector data description.}, url = {http://dblp.uni-trier.de/db/journals/eswa/eswa38.html#LiuLC11}, volume = 38, year = 2011 }