%0 Conference Paper %1 conf/ats/CookHIW11 %A Cook, Alejandro %A Hellebrand, Sybille %A Indlekofer, Thomas %A Wunderlich, Hans-Joachim %B Asian Test Symposium %D 2011 %I IEEE Computer Society %K dblp %P 285-290 %T Diagnostic Test of Robust Circuits. %U http://dblp.uni-trier.de/db/conf/ats/ats2011.html#CookHIW11 %@ 978-1-4577-1984-4

@inproceedings{conf/ats/CookHIW11, added-at = {2016-01-13T00:00:00.000+0100}, author = {Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2f999ecb7181123e9be2484465e744cd1/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2011}, ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.2011.55}, interhash = {9bce877f5807b651eccd7be6055327b5}, intrahash = {f999ecb7181123e9be2484465e744cd1}, isbn = {978-1-4577-1984-4}, keywords = {dblp}, pages = {285-290}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T14:23:14.000+0100}, title = {Diagnostic Test of Robust Circuits.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2011.html#CookHIW11}, year = 2011 }