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%0 Journal Article
%1 journals/mr/WangXZ10
%A Wang, H. Y.
%A Xiong, X. M.
%A Zhang, J. X.
%D 2010
%J Microelectronics Reliability
%K dblp
%N 6
%P 887-890
%T Moisture effect on the dielectric and structure of BaTiO3-based devices.
%U http://dblp.uni-trier.de/db/journals/mr/mr50.html#WangXZ10
%V 50
@article{journals/mr/WangXZ10,
added-at = {2010-09-29T00:00:00.000+0200},
author = {Wang, H. Y. and Xiong, X. M. and Zhang, J. X.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/28099eda642801fef661a81899a90c9e2/dblp},
ee = {http://dx.doi.org/10.1016/j.microrel.2010.01.004},
interhash = {9b9197d0638aa58cc00b342ff240d38c},
intrahash = {8099eda642801fef661a81899a90c9e2},
journal = {Microelectronics Reliability},
keywords = {dblp},
number = 6,
pages = {887-890},
timestamp = {2016-02-02T02:01:55.000+0100},
title = {Moisture effect on the dielectric and structure of BaTiO3-based devices.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#WangXZ10},
volume = 50,
year = 2010
}
