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%0 Conference Paper
%1 conf/ets/VenkatasubramanianCO11
%A Venkatasubramanian, Ramachandran
%A Chang, Doohwang
%A Ozev, Sule
%B European Test Symposium
%D 2011
%I IEEE Computer Society
%K dblp
%P 215
%T Analysis and Mitigation of Electromigration in RF Circuits: An LNA Case Study.
%U http://dblp.uni-trier.de/db/conf/ets/ets2011.html#VenkatasubramanianCO11
%@ 978-0-7695-4433-5
@inproceedings{conf/ets/VenkatasubramanianCO11,
added-at = {2015-08-18T00:00:00.000+0200},
author = {Venkatasubramanian, Ramachandran and Chang, Doohwang and Ozev, Sule},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e20448ba0a1f18f3ef354f7d786eaa77/dblp},
booktitle = {European Test Symposium},
crossref = {conf/ets/2011},
ee = {http://doi.ieeecomputersociety.org/10.1109/ETS.2011.50},
interhash = {9075570795ce0b5e462d16808b8157a0},
intrahash = {e20448ba0a1f18f3ef354f7d786eaa77},
isbn = {978-0-7695-4433-5},
keywords = {dblp},
pages = 215,
publisher = {IEEE Computer Society},
timestamp = {2016-02-02T15:20:06.000+0100},
title = {Analysis and Mitigation of Electromigration in RF Circuits: An LNA Case Study.},
url = {http://dblp.uni-trier.de/db/conf/ets/ets2011.html#VenkatasubramanianCO11},
year = 2011
}
