%0 Journal Article %1 journals/mr/NieLGX16 %A Nie, Kaiming %A Li, Jianxin %A Gao, Zhiyuan %A Xu, Jiangtao %D 2016 %J Microelectronics Reliability %K dblp %P 70-77 %T A transient noise simulation model for the analysis of the optimal number of stages of the analog accumulator in TDI CMOS image sensors. %U http://dblp.uni-trier.de/db/journals/mr/mr60.html#NieLGX16 %V 60

@article{journals/mr/NieLGX16, added-at = {2016-05-09T00:00:00.000+0200}, author = {Nie, Kaiming and Li, Jianxin and Gao, Zhiyuan and Xu, Jiangtao}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2c2cff5f178dce8f9cc6dc4e7a1c657b0/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2016.01.008}, interhash = {8e2d455d75f41c6105844c90a2185243}, intrahash = {c2cff5f178dce8f9cc6dc4e7a1c657b0}, journal = {Microelectronics Reliability}, keywords = {dblp}, pages = {70-77}, timestamp = {2016-05-10T09:31:59.000+0200}, title = {A transient noise simulation model for the analysis of the optimal number of stages of the analog accumulator in TDI CMOS image sensors.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr60.html#NieLGX16}, volume = 60, year = 2016 }