%0 Journal Article %1 journals/mr/KerberPVGK07 %A Kerber, A. %A Pantisano, Luigi %A Veloso, Anabela %A Groeseneken, Guido %A Kerber, M. %D 2007 %J Microelectronics Reliability %K dblp %N 4-5 %P 513-517 %T Reliability screening of high-k dielectrics based on voltage ramp stress. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#KerberPVGK07 %V 47

@article{journals/mr/KerberPVGK07, added-at = {2012-11-15T00:00:00.000+0100}, author = {Kerber, A. and Pantisano, Luigi and Veloso, Anabela and Groeseneken, Guido and Kerber, M.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/22ba7071b5e7472af14b4901b1af380f9/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2007.01.030}, interhash = {89cdc194343bbc8870176b5c2c49db97}, intrahash = {2ba7071b5e7472af14b4901b1af380f9}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {4-5}, pages = {513-517}, timestamp = {2016-02-02T02:01:18.000+0100}, title = {Reliability screening of high-k dielectrics based on voltage ramp stress.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#KerberPVGK07}, volume = 47, year = 2007 }