%0 Journal Article %1 journals/mr/DoriaMSCP12 %A Doria, Renan Trevisoli %A Martino, João Antonio %A Simoen, Eddy %A Claeys, Cor %A Pavanello, Marcelo Antonio %D 2012 %J Microelectronics Reliability %K dblp %N 3 %P 519-524 %T An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#DoriaMSCP12 %V 52

@article{journals/mr/DoriaMSCP12, added-at = {2012-03-06T00:00:00.000+0100}, author = {Doria, Renan Trevisoli and Martino, João Antonio and Simoen, Eddy and Claeys, Cor and Pavanello, Marcelo Antonio}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2f8825c74c143096fa86115fc135b387e/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2011.10.007}, interhash = {87974f48bb93081b7b947149de6f1f9c}, intrahash = {f8825c74c143096fa86115fc135b387e}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 3, pages = {519-524}, timestamp = {2016-02-02T02:01:15.000+0100}, title = {An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#DoriaMSCP12}, volume = 52, year = 2012 }