%0 Journal Article %1 journals/mr/DubecBPGBS07 %A Dubec, Viktor %A Bychikhin, Sergey %A Pogany, Dionyz %A Gornik, Erich %A Brodbeck, Tilo %A Stadler, Wolfgang %D 2007 %J Microelectronics Reliability %K dblp %N 9-11 %P 1539-1544 %T Backside interferometric methods for localization of ESD-induced leakage current and metal shorts. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#DubecBPGBS07 %V 47

@article{journals/mr/DubecBPGBS07, added-at = {2015-02-05T00:00:00.000+0100}, author = {Dubec, Viktor and Bychikhin, Sergey and Pogany, Dionyz and Gornik, Erich and Brodbeck, Tilo and Stadler, Wolfgang}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2db1634f99e2df4793c4084c9200fa8af/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2007.07.029}, interhash = {8694421ab6938cd9bdf48067aab370b3}, intrahash = {db1634f99e2df4793c4084c9200fa8af}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1539-1544}, timestamp = {2016-02-02T02:01:55.000+0100}, title = {Backside interferometric methods for localization of ESD-induced leakage current and metal shorts.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#DubecBPGBS07}, volume = 47, year = 2007 }