%0 Journal Article %1 journals/tcad/Jone93 %A Jone, Wen-Ben %D 1993 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 2 %P 336-348 %T Defect level estimation of circuit testing using sequential statistical analysis. %U http://dblp.uni-trier.de/db/journals/tcad/tcad12.html#Jone93 %V 12

@article{journals/tcad/Jone93, added-at = {2016-03-18T00:00:00.000+0100}, author = {Jone, Wen-Ben}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a894540c94827b4e1fff845d20576037/dblp}, ee = {http://dx.doi.org/10.1109/43.205012}, interhash = {8359adedbc9bda116480478a89bba4dd}, intrahash = {a894540c94827b4e1fff845d20576037}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 2, pages = {336-348}, timestamp = {2016-03-19T10:33:04.000+0100}, title = {Defect level estimation of circuit testing using sequential statistical analysis.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad12.html#Jone93}, volume = 12, year = 1993 }