%0 Journal Article %1 journals/mr/OConnorHKR11 %A O'Connor, Robert %A Hughes, Greg %A Kauerauf, Thomas %A Ragnarsson, Lars-Åke %D 2011 %J Microelectronics Reliability %K dblp %N 6 %P 1118-1122 %T Reliability of thin ZrO2 gate dielectric layers. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#OConnorHKR11 %V 51

@article{journals/mr/OConnorHKR11, added-at = {2014-11-19T00:00:00.000+0100}, author = {O'Connor, Robert and Hughes, Greg and Kauerauf, Thomas and Ragnarsson, Lars-Åke}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/25d7b632ff472a0064ea21c41c1271dc5/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2011.02.006}, interhash = {810c6256fc7c5ad4859f3646cc52c1d0}, intrahash = {5d7b632ff472a0064ea21c41c1271dc5}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 6, pages = {1118-1122}, timestamp = {2016-02-02T02:02:10.000+0100}, title = {Reliability of thin ZrO2 gate dielectric layers.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#OConnorHKR11}, volume = 51, year = 2011 }