%0 Journal Article %1 journals/mr/PieperS01 %A Pieper, Klaus-Willi %A Sauter, Martin %D 2001 %J Microelectronics Reliability %K dblp %N 1 %P 133-136 %T Direct temperature measurement of integrated microelectronic devices by thermally induced leakage currents. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#PieperS01 %V 41

@article{journals/mr/PieperS01, added-at = {2007-03-25T00:00:00.000+0100}, author = {Pieper, Klaus-Willi and Sauter, Martin}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2659e43653388517bdad8329151dbc1e9/dblp}, ee = {http://dx.doi.org/10.1016/S0026-2714(00)00221-3}, interhash = {800b48af38cad072179d7510d16c965f}, intrahash = {659e43653388517bdad8329151dbc1e9}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 1, pages = {133-136}, timestamp = {2016-02-02T02:01:22.000+0100}, title = {Direct temperature measurement of integrated microelectronic devices by thermally induced leakage currents.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#PieperS01}, volume = 41, year = 2001 }