%0 Conference Paper %1 conf/irps/AguirrePPFWE18 %A Aguirre, Fernando L. %A Pazos, Sebastián Matías %A Palumbo, Felix %A Fadida, Sivan %A Winter, Roy %A Eizenberg, Moshe %B IRPS %D 2018 %I IEEE %K dblp %P 3-1 %T Impact of forming gas annealing on the degradation dynamics of Ge-based MOS stacks. %U http://dblp.uni-trier.de/db/conf/irps/irps2018.html#AguirrePPFWE18 %@ 978-1-5386-5479-8

@inproceedings{conf/irps/AguirrePPFWE18, added-at = {2019-05-29T00:00:00.000+0200}, author = {Aguirre, Fernando L. and Pazos, Sebastián Matías and Palumbo, Felix and Fadida, Sivan and Winter, Roy and Eizenberg, Moshe}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2d0b3d687d954677ff1e3802a0043b91a/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2018}, ee = {https://doi.org/10.1109/IRPS.2018.8353663}, interhash = {7e4f906408df7bfa204f6d18b72e723b}, intrahash = {d0b3d687d954677ff1e3802a0043b91a}, isbn = {978-1-5386-5479-8}, keywords = {dblp}, pages = {3-1}, publisher = {IEEE}, timestamp = {2019-09-27T13:33:22.000+0200}, title = {Impact of forming gas annealing on the degradation dynamics of Ge-based MOS stacks.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#AguirrePPFWE18}, year = 2018 }