%0 Journal Article %1 journals/mr/LiWLZFL16 %A Li, Junxing %A Wang, Zhihua %A Liu, Xia %A Zhang, Yongbo %A Fu, Huimin %A Liu, Chengrui %D 2016 %J Microelectronics Reliability %K dblp %P 8-15 %T A Wiener process model for accelerated degradation analysis considering measurement errors. %U http://dblp.uni-trier.de/db/journals/mr/mr65.html#LiWLZFL16 %V 65

@article{journals/mr/LiWLZFL16, added-at = {2020-01-07T00:00:00.000+0100}, author = {Li, Junxing and Wang, Zhihua and Liu, Xia and Zhang, Yongbo and Fu, Huimin and Liu, Chengrui}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2046db49da65c62157de2e023ad063f2e/dblp}, ee = {https://doi.org/10.1016/j.microrel.2016.08.004}, interhash = {7dd2c24d1276925cedb8f7943f20c364}, intrahash = {046db49da65c62157de2e023ad063f2e}, journal = {Microelectronics Reliability}, keywords = {dblp}, pages = {8-15}, timestamp = {2020-01-09T07:46:10.000+0100}, title = {A Wiener process model for accelerated degradation analysis considering measurement errors.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr65.html#LiWLZFL16}, volume = 65, year = 2016 }