%0 Journal Article %1 journals/mr/PetersenCSVBP01 %A Petersen, R. %A Ceuninck, Ward De %A Schepper, Luc De %A Vendier, Olivier %A Blanck, Hervé %A Pons, Dominique %D 2001 %J Microelectronics Reliability %K dblp %N 9-10 %P 1591-1596 %T Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluation. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#PetersenCSVBP01 %V 41

@article{journals/mr/PetersenCSVBP01, added-at = {2015-02-04T00:00:00.000+0100}, author = {Petersen, R. and Ceuninck, Ward De and Schepper, Luc De and Vendier, Olivier and Blanck, Hervé and Pons, Dominique}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2489c1174c7dd7481897f0515e8469711/dblp}, ee = {http://dx.doi.org/10.1016/S0026-2714(01)00195-0}, interhash = {79347dc6474623e3ca88b960101b0155}, intrahash = {489c1174c7dd7481897f0515e8469711}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-10}, pages = {1591-1596}, timestamp = {2016-02-02T02:02:17.000+0100}, title = {Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluation.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#PetersenCSVBP01}, volume = 41, year = 2001 }