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%0 Journal Article
%1 journals/mr/NenadovicCTNSSJS05
%A Nenadovic, N.
%A Cuoco, V.
%A Theeuwen, S. J. C. H.
%A Nanver, Lis K.
%A Schellevis, Hugo
%A Spierings, G.
%A Jos, H. F. F.
%A Slotboom, J. W.
%D 2005
%J Microelectronics Reliability
%K dblp
%N 3-4
%P 541-550
%T Electrothermal characterization of silicon-on-glass VDMOSFETs.
%U http://dblp.uni-trier.de/db/journals/mr/mr45.html#NenadovicCTNSSJS05
%V 45
@article{journals/mr/NenadovicCTNSSJS05,
added-at = {2019-07-10T00:00:00.000+0200},
author = {Nenadovic, N. and Cuoco, V. and Theeuwen, S. J. C. H. and Nanver, Lis K. and Schellevis, Hugo and Spierings, G. and Jos, H. F. F. and Slotboom, J. W.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a83cbbe4ecad1a8d866e9d4887928b8f/dblp},
ee = {https://doi.org/10.1016/j.microrel.2004.08.015},
interhash = {784dcd310ed48f868233989158013e79},
intrahash = {a83cbbe4ecad1a8d866e9d4887928b8f},
journal = {Microelectronics Reliability},
keywords = {dblp},
number = {3-4},
pages = {541-550},
timestamp = {2019-09-27T10:58:13.000+0200},
title = {Electrothermal characterization of silicon-on-glass VDMOSFETs.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#NenadovicCTNSSJS05},
volume = 45,
year = 2005
}
