%0 Conference Paper %1 conf/cicc/Rearick07 %A Rearick, Jeff %B CICC %D 2007 %I IEEE %K dblp %P 153-156 %T Embedded Test Features for High-Speed Serial I/O. %U http://dblp.uni-trier.de/db/conf/cicc/cicc2007.html#Rearick07 %@ 978-1-4244-1623-3

@inproceedings{conf/cicc/Rearick07, added-at = {2014-04-01T00:00:00.000+0200}, author = {Rearick, Jeff}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/221389cfe3858b82c3b9f40f07fcf4ce9/dblp}, booktitle = {CICC}, crossref = {conf/cicc/2007}, ee = {http://dx.doi.org/10.1109/CICC.2007.4405702}, interhash = {761f82b317585d0188c699097a8ed9b1}, intrahash = {21389cfe3858b82c3b9f40f07fcf4ce9}, isbn = {978-1-4244-1623-3}, keywords = {dblp}, pages = {153-156}, publisher = {IEEE}, timestamp = {2016-02-02T12:54:46.000+0100}, title = {Embedded Test Features for High-Speed Serial I/O.}, url = {http://dblp.uni-trier.de/db/conf/cicc/cicc2007.html#Rearick07}, year = 2007 }