%0 Journal Article %1 journals/mr/WolfGSW05 %A Wolf, Heinrich %A Gieser, Horst A. %A Stadler, Wolfgang %A Wilkening, Wolfgang %D 2005 %J Microelectronics Reliability %K dblp %N 2 %P 279-285 %T Capacitively coupled transmission line pulsing cc-TLP--a traceable and reproducible stress method in the CDM-domain. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#WolfGSW05 %V 45

@article{journals/mr/WolfGSW05, added-at = {2018-11-30T00:00:00.000+0100}, author = {Wolf, Heinrich and Gieser, Horst A. and Stadler, Wolfgang and Wilkening, Wolfgang}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/22a122368175f805bec2d77ece7a6c2a5/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.05.015}, interhash = {6f667d242501fd906d0d29291a8b9887}, intrahash = {2a122368175f805bec2d77ece7a6c2a5}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 2, pages = {279-285}, timestamp = {2019-09-27T10:58:15.000+0200}, title = {Capacitively coupled transmission line pulsing cc-TLP--a traceable and reproducible stress method in the CDM-domain.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#WolfGSW05}, volume = 45, year = 2005 }