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%0 Journal Article
%1 journals/mr/AresuCDCAMSDKD02
%A Aresu, Stefano
%A Ceuninck, Ward De
%A Dreesen, R.
%A Croes, Kris
%A Andries, E.
%A Manca, Jean
%A Schepper, Luc De
%A Degraeve, Robin
%A Kaczer, Ben
%A D'Olieslaeger, Marc
%D 2002
%J Microelectronics Reliability
%K dblp
%N 9-11
%P 1485-1489
%T High-resolution SILC measurements of thin SiO2 at ultra low voltages.
%U http://dblp.uni-trier.de/db/journals/mr/mr42.html#AresuCDCAMSDKD02
%V 42
@article{journals/mr/AresuCDCAMSDKD02,
added-at = {2015-03-03T00:00:00.000+0100},
author = {Aresu, Stefano and Ceuninck, Ward De and Dreesen, R. and Croes, Kris and Andries, E. and Manca, Jean and Schepper, Luc De and Degraeve, Robin and Kaczer, Ben and D'Olieslaeger, Marc},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/229ea933c3699cebe72c58ee8f60e7caa/dblp},
ee = {http://dx.doi.org/10.1016/S0026-2714(02)00175-0},
interhash = {6eee6e1a265c2c77c41847a485d23755},
intrahash = {29ea933c3699cebe72c58ee8f60e7caa},
journal = {Microelectronics Reliability},
keywords = {dblp},
number = {9-11},
pages = {1485-1489},
timestamp = {2016-02-02T02:02:25.000+0100},
title = {High-resolution SILC measurements of thin SiO2 at ultra low voltages.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#AresuCDCAMSDKD02},
volume = 42,
year = 2002
}
