%0 Conference Paper %1 conf/ats/LavabreBRL95 %A Lavabre, S. %A Bertrand, Yves %A Renovell, Michel %A Landrault, Christian %B Asian Test Symposium %D 1995 %I IEEE Computer Society %K dblp %P 160-168 %T Test configurations to enhance the testability of sequential circuits. %U http://dblp.uni-trier.de/db/conf/ats/ats1995.html#LavabreBRL95 %@ 0-8186-7129-7

@inproceedings{conf/ats/LavabreBRL95, added-at = {2016-01-13T00:00:00.000+0100}, author = {Lavabre, S. and Bertrand, Yves and Renovell, Michel and Landrault, Christian}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/229391fe44809699b6eb0249fd00d7f45/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1995}, ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.1995.485332}, interhash = {6e955ae3e041fb3f0f69bab428c4b7b1}, intrahash = {29391fe44809699b6eb0249fd00d7f45}, isbn = {0-8186-7129-7}, keywords = {dblp}, pages = {160-168}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T14:23:18.000+0100}, title = {Test configurations to enhance the testability of sequential circuits.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1995.html#LavabreBRL95}, year = 1995 }