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%0 Conference Paper
%1 conf/latw/LavrattiBCVM13
%A Lavratti, Felipe
%A Bolzani, Letícia Maria Veiras
%A Calimera, Andrea
%A Vargas, Fabian
%A Macii, Enrico
%B LATW
%D 2013
%I IEEE Computer Society
%K dblp
%P 1-6
%T Technique based on On-Chip Current Sensors and Neighbourhood Comparison Logic to detect resistive-open defects in SRAMs.
%U http://dblp.uni-trier.de/db/conf/latw/latw2013.html#LavrattiBCVM13
%@ 978-1-4799-0597-3
@inproceedings{conf/latw/LavrattiBCVM13,
added-at = {2015-08-26T00:00:00.000+0200},
author = {Lavratti, Felipe and Bolzani, Letícia Maria Veiras and Calimera, Andrea and Vargas, Fabian and Macii, Enrico},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/23be170584e480c0abc610a8cad6378c9/dblp},
booktitle = {LATW},
crossref = {conf/latw/2013},
ee = {http://doi.ieeecomputersociety.org/10.1109/LATW.2013.6562688},
interhash = {6dd46d7796490f3d22d8e20c9cd72811},
intrahash = {3be170584e480c0abc610a8cad6378c9},
isbn = {978-1-4799-0597-3},
keywords = {dblp},
pages = {1-6},
publisher = {IEEE Computer Society},
timestamp = {2016-02-02T11:13:15.000+0100},
title = {Technique based on On-Chip Current Sensors and Neighbourhood Comparison Logic to detect resistive-open defects in SRAMs.},
url = {http://dblp.uni-trier.de/db/conf/latw/latw2013.html#LavrattiBCVM13},
year = 2013
}