%0 Journal Article %1 journals/mr/RafiSHMCOC06 %A Rafí, Joan Marc %A Simoen, Eddy %A Hayama, Kiyoteru %A Mercha, Abdelkarim %A Campabadal, Francesca %A Ohyama, Hidenori %A Claeys, Cor %D 2006 %J Microelectronics Reliability %K dblp %N 9-11 %P 1657-1663 %T Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted SOI nMOSFETs. %U http://dblp.uni-trier.de/db/journals/mr/mr46.html#RafiSHMCOC06 %V 46

@article{journals/mr/RafiSHMCOC06, added-at = {2019-06-02T00:00:00.000+0200}, author = {Rafí, Joan Marc and Simoen, Eddy and Hayama, Kiyoteru and Mercha, Abdelkarim and Campabadal, Francesca and Ohyama, Hidenori and Claeys, Cor}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2ec8d8896c82b3f99e016c8216b67195d/dblp}, ee = {https://www.wikidata.org/entity/Q61825828}, interhash = {6b5716d2aa031bf81c9a7e1f89943f3d}, intrahash = {ec8d8896c82b3f99e016c8216b67195d}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1657-1663}, timestamp = {2019-09-27T10:58:24.000+0200}, title = {Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted SOI nMOSFETs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#RafiSHMCOC06}, volume = 46, year = 2006 }