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%0 Journal Article
%1 Kragl_EMC2025
%A Kragl, R.
%A Oberdieck, K.
%A Spanos, K.
%A Beushausen, S.
%A Kallfass, I.
%D 2025
%J in Proc. International Symposium on ElectroMagnetic Compatibility in Europe (EMC Europe), Paris
%K imported
%T Semiconductor-Focused Simulation Environment for Emitted Noise Sensitivity of MOSFET Parameters
@article{Kragl_EMC2025,
added-at = {2025-05-26T10:46:09.000+0200},
author = {Kragl, R. and Oberdieck, K. and Spanos, K. and Beushausen, S. and Kallfass, I.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e66cf160cbe87c66de03c5213125f695/ingmarkallfass},
date-added = {2025-02-02 11:29:31 +0100},
date-modified = {2025-05-25 19:40:16 +0200},
interhash = {685fec8250357b9aff79f4f2a4b3f225},
intrahash = {e66cf160cbe87c66de03c5213125f695},
journal = {in Proc. International Symposium on ElectroMagnetic Compatibility in Europe (EMC Europe), Paris},
keywords = {imported},
timestamp = {2025-05-26T10:46:09.000+0200},
title = {Semiconductor-Focused Simulation Environment for Emitted Noise Sensitivity of MOSFET Parameters},
year = 2025
}