%0 Conference Paper %1 conf/itc/KuxUKSMBH14 %A Kux, Andreas %A Ullmann, Rudolf %A Kern, Thomas %A Strunz, Roland %A Melzner, Hanno %A Beuven, Stephan %A Haase, Andreas %B ITC %D 2014 %I IEEE Computer Society %K dblp %P 1-7 %T Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening. %U http://dblp.uni-trier.de/db/conf/itc/itc2014.html#KuxUKSMBH14 %@ 978-1-4799-4722-5

@inproceedings{conf/itc/KuxUKSMBH14, added-at = {2015-08-26T00:00:00.000+0200}, author = {Kux, Andreas and Ullmann, Rudolf and Kern, Thomas and Strunz, Roland and Melzner, Hanno and Beuven, Stephan and Haase, Andreas}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/22636fa3fb1143ab07d04275d484eab3e/dblp}, booktitle = {ITC}, crossref = {conf/itc/2014}, ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035298}, interhash = {67638907a5107a27d5ecb36aefb62284}, intrahash = {2636fa3fb1143ab07d04275d484eab3e}, isbn = {978-1-4799-4722-5}, keywords = {dblp}, pages = {1-7}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T15:32:22.000+0100}, title = {Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2014.html#KuxUKSMBH14}, year = 2014 }