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%0 Conference Paper
%1 conf/dac/LaPaughL83
%A LaPaugh, Andrea S.
%A Lipton, Richard J.
%B DAC
%D 1983
%E Radke, Charles E.
%I ACM/IEEE
%K dblp
%P 713-716
%T Total stuct-at-fault testing by circuit transformation.
%U http://dblp.uni-trier.de/db/conf/dac/dac1983.html#LaPaughL83
%@ 0-8186-0026-8
@inproceedings{conf/dac/LaPaughL83,
added-at = {2012-03-01T00:00:00.000+0100},
author = {LaPaugh, Andrea S. and Lipton, Richard J.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a86c66c1eb297294a9732fefe6edee5e/dblp},
booktitle = {DAC},
crossref = {conf/dac/1983},
editor = {Radke, Charles E.},
ee = {http://dl.acm.org/citation.cfm?id=800748},
interhash = {6748a47f0c5368f277db13481fc1ae5c},
intrahash = {a86c66c1eb297294a9732fefe6edee5e},
isbn = {0-8186-0026-8},
keywords = {dblp},
pages = {713-716},
publisher = {ACM/IEEE},
timestamp = {2016-02-02T13:34:21.000+0100},
title = {Total stuct-at-fault testing by circuit transformation.},
url = {http://dblp.uni-trier.de/db/conf/dac/dac1983.html#LaPaughL83},
year = 1983
}
