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%0 Conference Paper
%1 conf/essderc/BaziziZHBTGJJMK14
%A Bazizi, E. M.
%A Zaka, Alban
%A Herrmann, Tom
%A Benistant, Francis
%A Tin, J. H. M.
%A Goh, J. P.
%A Jiang, L.
%A Joshi, M.
%A van Meer, H.
%A Korablev, K.
%B ESSDERC
%D 2014
%I IEEE
%K dblp
%P 341-344
%T Advanced TCAD for predictive FinFETs Vth mismatch using full 3D process/device simulation.
%U http://dblp.uni-trier.de/db/conf/essderc/essderc2014.html#BaziziZHBTGJJMK14
%@ 978-1-4799-4378-4
@inproceedings{conf/essderc/BaziziZHBTGJJMK14,
added-at = {2018-11-13T00:00:00.000+0100},
author = {Bazizi, E. M. and Zaka, Alban and Herrmann, Tom and Benistant, Francis and Tin, J. H. M. and Goh, J. P. and Jiang, L. and Joshi, M. and van Meer, H. and Korablev, K.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2c5e18f0977b935294971ec6845764c01/dblp},
booktitle = {ESSDERC},
crossref = {conf/essderc/2014},
ee = {https://doi.org/10.1109/ESSDERC.2014.6948830},
interhash = {670d0b600ed359cb93d70e748cf0a978},
intrahash = {c5e18f0977b935294971ec6845764c01},
isbn = {978-1-4799-4378-4},
keywords = {dblp},
pages = {341-344},
publisher = {IEEE},
timestamp = {2019-09-27T21:18:01.000+0200},
title = {Advanced TCAD for predictive FinFETs Vth mismatch using full 3D process/device simulation.},
url = {http://dblp.uni-trier.de/db/conf/essderc/essderc2014.html#BaziziZHBTGJJMK14},
year = 2014
}
