%0 Journal Article %1 journals/ress/OhCKYP15 %A Oh, Hyun-Seok %A yun Choi, Seung %A Kim, Keunsu %A Youn, Byeng D. %A Pecht, Michael G. %D 2015 %J Rel. Eng. & Sys. Safety %K dblp %P 92-99 %T An empirical model to describe performance degradation for warranty abuse detection in portable electronics. %U http://dblp.uni-trier.de/db/journals/ress/ress142.html#OhCKYP15 %V 142

@article{journals/ress/OhCKYP15, added-at = {2015-09-17T00:00:00.000+0200}, author = {Oh, Hyun-Seok and yun Choi, Seung and Kim, Keunsu and Youn, Byeng D. and Pecht, Michael G.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/21ec3143070c404e87801e48c0543d46f/dblp}, ee = {http://dx.doi.org/10.1016/j.ress.2015.04.019}, interhash = {66b33093abc8ba33f94e162003b4ae49}, intrahash = {1ec3143070c404e87801e48c0543d46f}, journal = {Rel. Eng. & Sys. Safety}, keywords = {dblp}, pages = {92-99}, timestamp = {2016-02-02T01:40:57.000+0100}, title = {An empirical model to describe performance degradation for warranty abuse detection in portable electronics.}, url = {http://dblp.uni-trier.de/db/journals/ress/ress142.html#OhCKYP15}, volume = 142, year = 2015 }