%0 Journal Article %1 journals/mr/QiXGW15 %A Qi, Chunhua %A Xiao, Liyi %A Guo, Jing %A Wang, Tianqi %D 2015 %J Microelectronics Reliability %K dblp %N 6 %P 863-872 %T Low cost and highly reliable radiation hardened latch design in 65 nm CMOS technology. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#QiXGW15 %V 55

@article{journals/mr/QiXGW15, added-at = {2015-05-12T00:00:00.000+0200}, author = {Qi, Chunhua and Xiao, Liyi and Guo, Jing and Wang, Tianqi}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/212f43e46208478673cb52c7daa4757b6/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2015.03.014}, interhash = {6674109bcf4126989a81772b79bd057c}, intrahash = {12f43e46208478673cb52c7daa4757b6}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 6, pages = {863-872}, timestamp = {2016-02-02T02:01:22.000+0100}, title = {Low cost and highly reliable radiation hardened latch design in 65 nm CMOS technology.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#QiXGW15}, volume = 55, year = 2015 }