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%0 Journal Article
%1 journals/mr/CovaMDFJ02
%A Cova, Paolo
%A Menozzi, Roberto
%A Dammann, Maximilian
%A Feltgen, T.
%A Jantz, W.
%D 2002
%J Microelectronics Reliability
%K dblp
%N 9-11
%P 1587-1592
%T High-field step-stress and long term stability of PHEMTs with different gate and recess lengths.
%U http://dblp.uni-trier.de/db/journals/mr/mr42.html#CovaMDFJ02
%V 42
@article{journals/mr/CovaMDFJ02,
added-at = {2019-06-30T00:00:00.000+0200},
author = {Cova, Paolo and Menozzi, Roberto and Dammann, Maximilian and Feltgen, T. and Jantz, W.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/290f02c2f12dd17e0d5a07648a460a889/dblp},
ee = {https://doi.org/10.1016/S0026-2714(02)00195-6},
interhash = {1618f53cbfa533bae0e76a6c3e6b8aed},
intrahash = {90f02c2f12dd17e0d5a07648a460a889},
journal = {Microelectronics Reliability},
keywords = {dblp},
number = {9-11},
pages = {1587-1592},
timestamp = {2019-09-27T10:58:10.000+0200},
title = {High-field step-stress and long term stability of PHEMTs with different gate and recess lengths.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#CovaMDFJ02},
volume = 42,
year = 2002
}