%0 Conference Paper %1 conf/csreaESA/HanL04 %A Han, Yinhe %A Li, Xiaowei %B ESA/VLSI %D 2004 %E Arabnia, Hamid R. %E Guo, Minyi %E Yang, Laurence Tianruo %I CSREA Press %K dblp %P 374-381 %T Simultaneous Reduction of Test Data Volume and Testing Power for Scan-Based Test. %U http://dblp.uni-trier.de/db/conf/csreaESA/csreaESA2004.html#HanL04 %@ 1-932415-41-6

@inproceedings{conf/csreaESA/HanL04, added-at = {2012-12-06T00:00:00.000+0100}, author = {Han, Yinhe and Li, Xiaowei}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2570d0e1fb99285bd527affbd3800979f/dblp}, booktitle = {ESA/VLSI}, crossref = {conf/csreaESA/2004}, editor = {Arabnia, Hamid R. and Guo, Minyi and Yang, Laurence Tianruo}, interhash = {60f421fd5f0097888ce3fb208afcbd9e}, intrahash = {570d0e1fb99285bd527affbd3800979f}, isbn = {1-932415-41-6}, keywords = {dblp}, pages = {374-381}, publisher = {CSREA Press}, timestamp = {2016-02-02T13:22:20.000+0100}, title = {Simultaneous Reduction of Test Data Volume and Testing Power for Scan-Based Test.}, url = {http://dblp.uni-trier.de/db/conf/csreaESA/csreaESA2004.html#HanL04}, year = 2004 }