%0 Journal Article %1 journals/et/WaliDVBGR17 %A Wali, Imran %A Deveautour, Bastien %A Virazel, Arnaud %A Bosio, Alberto %A Girard, Patrick %A Reorda, Matteo Sonza %D 2017 %J J. Electronic Testing %K dblp %N 1 %P 25-36 %T A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits. %U http://dblp.uni-trier.de/db/journals/et/et33.html#WaliDVBGR17 %V 33

@article{journals/et/WaliDVBGR17, added-at = {2019-06-02T00:00:00.000+0200}, author = {Wali, Imran and Deveautour, Bastien and Virazel, Arnaud and Bosio, Alberto and Girard, Patrick and Reorda, Matteo Sonza}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2dfb817d68c4ce9c32136dc3f5b369cf6/dblp}, ee = {https://www.wikidata.org/entity/Q60245226}, interhash = {6051bb9298aa1d380dcf5b1fd1209bd2}, intrahash = {dfb817d68c4ce9c32136dc3f5b369cf6}, journal = {J. Electronic Testing}, keywords = {dblp}, number = 1, pages = {25-36}, timestamp = {2019-09-27T08:45:09.000+0200}, title = {A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits.}, url = {http://dblp.uni-trier.de/db/journals/et/et33.html#WaliDVBGR17}, volume = 33, year = 2017 }