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%0 Journal Article
%1 journals/mr/KhoMGBONL10
%A Kho, R. M.
%A Moonen, A. J.
%A Girault, V. M.
%A Bisschop, Jaap
%A Olthof, E. H. T.
%A Nath, S.
%A Liang, Z. N.
%D 2010
%J Microelectronics Reliability
%K dblp
%N 9-11
%P 1210-1214
%T Determination of the stress level for voltage screen of integrated circuits.
%U http://dblp.uni-trier.de/db/journals/mr/mr50.html#KhoMGBONL10
%V 50
@article{journals/mr/KhoMGBONL10,
added-at = {2010-09-29T00:00:00.000+0200},
author = {Kho, R. M. and Moonen, A. J. and Girault, V. M. and Bisschop, Jaap and Olthof, E. H. T. and Nath, S. and Liang, Z. N.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/29ce3b9db59192b167761436265b408ce/dblp},
ee = {http://dx.doi.org/10.1016/j.microrel.2010.07.103},
interhash = {5dbb7ee2a7744005951a75ebe61f61ed},
intrahash = {9ce3b9db59192b167761436265b408ce},
journal = {Microelectronics Reliability},
keywords = {dblp},
number = {9-11},
pages = {1210-1214},
timestamp = {2016-02-02T01:59:40.000+0100},
title = {Determination of the stress level for voltage screen of integrated circuits.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#KhoMGBONL10},
volume = 50,
year = 2010
}
