%0 Journal Article %1 journals/mr/MeneghiniTSMVMZ07 %A Meneghini, Matteo %A Trevisanello, L. %A Sanna, C. %A Mura, Giovanna %A Vanzi, Massimo %A Meneghesso, Gaudenzio %A Zanoni, Enrico %D 2007 %J Microelectronics Reliability %K dblp %N 9-11 %P 1625-1629 %T High temperature electro-optical degradation of InGaN/GaN HBLEDs. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#MeneghiniTSMVMZ07 %V 47

@article{journals/mr/MeneghiniTSMVMZ07, added-at = {2015-02-05T00:00:00.000+0100}, author = {Meneghini, Matteo and Trevisanello, L. and Sanna, C. and Mura, Giovanna and Vanzi, Massimo and Meneghesso, Gaudenzio and Zanoni, Enrico}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/27d51ca2359a994bb1fa24fbc3685c2ee/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2007.07.081}, interhash = {5b55e4e5d4350c406339aa76e849cf0b}, intrahash = {7d51ca2359a994bb1fa24fbc3685c2ee}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1625-1629}, timestamp = {2016-02-02T02:01:22.000+0100}, title = {High temperature electro-optical degradation of InGaN/GaN HBLEDs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#MeneghiniTSMVMZ07}, volume = 47, year = 2007 }